Блог Председателя Комитета по техническому регулированию и метрологии Мухамбетова Габит Мухамбетовича
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Measurements in Science and Technology – a bridge to innovation

08.06.2010 Conference “Measurements in Science and Technology – a bridge to innovation”, devoted to celebration of the World Metrology Day, took place in 20th of May, 2010, in the Measurement Standards Center of Astana.

More than 40 representatives of the country’s metrological services and scientist and educational institutions took part in the Conference. Guest of honour of the Conference was a President of the International Committee of Legal Metrology, head of the national metrology body of Canada, Mr. Alan Jonston, who had the floor about the mission of the International Organization of Legal Metrology (OIML) and It’s role in development of international cooperation and global metrological system.

Mr. Talgat Momyshev, Vice-Chairman of the Committee for Technical Regulation addressed words of welcome to the Conference participants, underlining that ensuring of measurements uniformity contribute to successful realization of the State Programme on forced industrial and innovational development  for years 2010-2014, and also to development of trade, economy, science and technical links between countries and economies.

Mr. Vassiliy Mikhalchenko, General Director of “Kazakhstan Institute of Metrology” reported about the state measurement standards base and results of scientific researches in the field of metrology. Representatives of the Kazakhstan Institute of Standardization and Certification and National Centre of Accreditation had the floor about the systems of technical regulation and accreditation in the field of conformity assessment.
Representatives of the state administrative bodies, scientific-research and educational institutes informed about role and application of measurements  in solving of theoretical and practical aspects of scientific researches.

On the Conference the results and the winners of the Best Young Metrologist of the Year 2010 Award were announced, and by tradition in the World Metrology Day celebration the best specialists in metrology of the country, who have contributed much in development and improvement of the state metrological system, were given special awards.

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